Understanding the features of a non-contact metrology platform versus a traditional contact coordinate measuring machine (CMM) can help manufacturers choose the right equipment for inspection.
Using a multisensor array, non-contact metrology systems quickly measure parts.
- Manual or programmable
- Mechanical touch probes and OMM
- Slow data capture of discrete points
- May mar sensitive surfaces
Non-Contact Metrology Platform
- 100% inspection
- Multisensor system
- Fast capture of multiple data points
- Non-contact measurement of multiple surfaces, color and gloss
- Metrology, cosmetic and defect detection