Sub-Micron and Nanometer Repeatability

DWFritz Automation’s engineers are experts at developing machines that can break the sub-micron and nanometer barrier when it comes to repeatability in metrology applications. By utilizing the latest technology in optics, vision, lasers, and stages, we have achieved repeatability below the 1-micron level. This capability is particularly useful for MEMS process control and metrology tools.

Featured Projects

Precision Part Inspection System

0.2-Micron Fixture Repeatability Provides Ability To Take 500 Measurements Across 9 Process Steps.
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Automated Wafer Metrology Tool

DWFritz solves challenges posed by bowed wafers and achieves < 1 micron accuracy in 3-D, from one side to the other.
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Related Projects

Six-Axis Automated Inspection System: This system enables high-throughput inspection of many different types of implants/small parts (screws, hooks, connectors, etc) using high-performance machine vision, a high-precision, six-axis robot, and sophisticated software. Patent Pending, 2006.
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local navigation for Technologies And Capabilities: 3-D Metrology; Automated Assembly; Automated Sorting; 2-sided wafer inspection; Automated Storage and Retrieval Systems; CE, UL & CSA Certifications; Clean Room Machines; Custom Graphical User Interface; Inspection and Quality Assurance Machines; Integrated Motion Control; Lamination and Bonding; Laser Technology; Loading and Unloading Machines; Machine Vision; Metrology; Part Transfer Equipment; PC Controls; Pick and Place Handling; PLC Controls; Precision Dispensing; Precision Positioning and Alignment; Robotics; SECS-GEM Compliance; Sub-Micron and Nanometer Repeatability; Ultra Thin Parts Handling; Wafer Attach; Wafer Handling Tools; Web Handling Machines; Wet and Corrosive Processes

Evaluate My Project

Contact DWFritz Automation through this website or telephone us at (503) 598-9393 to get a free evaluation of your project. We’ll review your automation needs and provide an analysis of your requirements. Get in touch.