2-Sided Wafer Inspection

DWFritz builds custom inspection and metrology tools capable of sub-micron accuracy and nanometer level repeatability. We have proven ability to compare and measure features on opposite sides of a wafer or other object. We utilize optical vision, line scan, laser, capacitive, and other sensor technologies to perform inspection functions.

Featured Projects

Automated Wafer Metrology Tool

DWFritz solves challenges posed by bowed wafers and achieves < 1 micron accuracy in 3-D, from one side to the other.
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local navigation for Technologies And Capabilities: 3-D Metrology; Automated Assembly; Automated Sorting; 2-Sided Wafer Inspection; Automated Storage and Retrieval Systems; Clean Room Machines; Fluidics and Wet Processes; Inspection and Quality Assurance Machines; Lamination and Bonding; Large-Scale Automation Deployment; Laser Technology; Loading and Unloading Machines; Machine Vision; Metrology; Part Transfer Equipment; Pick and Place Handling; Precision Dispensing; Precision Positioning and Alignment; Robotics; Sub-Micron and Nanometer Repeatability; Ultra Thin Parts Handling; Wafer Attach; Wafer Handling Tools; Web Handling Machines

Evaluate My Project

Contact DWFritz Automation through this website or telephone us at (503) 598-9393 to get a free evaluation of your project. We’ll review your automation needs and provide an analysis of your requirements. Get in touch.